Optimising the thickness determination of homopolymers and diblock copolymers using optical spectral reflectance during solvent vapour annealing

Nathan Hugh Barr

Studenteropgave: Speciale


In this thesis, the solvent vapour annealing of the homopolymers polystyrene and polyisoprene thin films and the diblock copolymer polystyrene-b-polyisoprene thin film have been investigated using the experimental technique optical spectral reflectance and the thickness of the thin films have been modelled using the Fresnel equations. The layered model consists of an ambient with a refractive index, a homogeneous thin film with a refractive index and thickness, a silicon oxide layer fixed at $\SI{2}{\nano\meter}$ and a silicon wafer. Both the silicon oxide layer and silicon wafer have refractive indices and have been taken from Ocean Optics Nano-Calc software \cite{nanocalcmanual}. A fitting protocol has been implemented using the mean square error and three values are fitted per measurement, the refractive index for the ambient, the refractive index for the thin film and the thickness of the thin film. The modelling and fitting for the homopolymers polystyrene and polyisoprene seem optimal whereas when applied to the polystyrene-b-polyisoprene thin film the modelling is suboptimal.

UddannelserMatematik, (Bachelor/kandidatuddannelse) KandidatFysik, (Bachelor/kandidatuddannelse) Master
Udgivelsesdato2 apr. 2019
Antal sider42
VejledereDorthe Posselt


  • Optical Spectral Reflectance
  • Polystyrene
  • Polyisoprene
  • Polystyrene-b-polyisoprene
  • Solvent vapour annealing
  • Thin films
  • Polymers