High-energy diffraction microscopy at the advanced photon source

U. Lienert, S.F. Li, C.M. Hefferan, J. Lind, R.M. Suter, J.V. Bernier, N.R. Barton, M.C. Brandes, M.J. Mills, M.P. Miller, Bo Jakobsen, W. Pantleon

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

The status of the High Energy Diffraction Microscopy (HEDM) program at the 1-ID beam line of the Advanced Photon Source is reported. HEDM applies high energy synchrotron radiation for the grain and sub-grain scale structural and mechanical characterization of polycrystalline bulk materials in situ during thermomechanical loading. Case studies demonstrate the mapping of grain boundary topology, the evaluation of stress tensors of individual grains during tensile deformation and comparison to a finite element modeling simulation, and the characterization of evolving dislocation structure. Complementary information is obtained by post mortem electron microscopy on the same sample volume previously investigated by HEDM.
OriginalsprogEngelsk
TidsskriftJ O M
Vol/bind63
Udgave nummer7
Sider (fra-til)70-77
Antal sider8
ISSN1047-4838
DOI
StatusUdgivet - jul. 2011

Citer dette

Lienert, U., Li, S. F., Hefferan, C. M., Lind, J., Suter, R. M., Bernier, J. V., ... Pantleon, W. (2011). High-energy diffraction microscopy at the advanced photon source. J O M, 63(7), 70-77. https://doi.org/10.1007/s11837-011-0116-0
Lienert, U. ; Li, S.F. ; Hefferan, C.M. ; Lind, J. ; Suter, R.M. ; Bernier, J.V. ; Barton, N.R. ; Brandes, M.C. ; Mills, M.J. ; Miller, M.P. ; Jakobsen, Bo ; Pantleon, W. / High-energy diffraction microscopy at the advanced photon source. I: J O M. 2011 ; Bind 63, Nr. 7. s. 70-77.
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Lienert, U, Li, SF, Hefferan, CM, Lind, J, Suter, RM, Bernier, JV, Barton, NR, Brandes, MC, Mills, MJ, Miller, MP, Jakobsen, B & Pantleon, W 2011, 'High-energy diffraction microscopy at the advanced photon source' J O M, bind 63, nr. 7, s. 70-77. https://doi.org/10.1007/s11837-011-0116-0

High-energy diffraction microscopy at the advanced photon source. / Lienert, U.; Li, S.F.; Hefferan, C.M.; Lind, J.; Suter, R.M.; Bernier, J.V.; Barton, N.R.; Brandes, M.C.; Mills, M.J.; Miller, M.P.; Jakobsen, Bo; Pantleon, W.

I: J O M, Bind 63, Nr. 7, 07.2011, s. 70-77.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - High-energy diffraction microscopy at the advanced photon source

AU - Lienert, U.

AU - Li, S.F.

AU - Hefferan, C.M.

AU - Lind, J.

AU - Suter, R.M.

AU - Bernier, J.V.

AU - Barton, N.R.

AU - Brandes, M.C.

AU - Mills, M.J.

AU - Miller, M.P.

AU - Jakobsen, Bo

AU - Pantleon, W.

PY - 2011/7

Y1 - 2011/7

N2 - The status of the High Energy Diffraction Microscopy (HEDM) program at the 1-ID beam line of the Advanced Photon Source is reported. HEDM applies high energy synchrotron radiation for the grain and sub-grain scale structural and mechanical characterization of polycrystalline bulk materials in situ during thermomechanical loading. Case studies demonstrate the mapping of grain boundary topology, the evaluation of stress tensors of individual grains during tensile deformation and comparison to a finite element modeling simulation, and the characterization of evolving dislocation structure. Complementary information is obtained by post mortem electron microscopy on the same sample volume previously investigated by HEDM.

AB - The status of the High Energy Diffraction Microscopy (HEDM) program at the 1-ID beam line of the Advanced Photon Source is reported. HEDM applies high energy synchrotron radiation for the grain and sub-grain scale structural and mechanical characterization of polycrystalline bulk materials in situ during thermomechanical loading. Case studies demonstrate the mapping of grain boundary topology, the evaluation of stress tensors of individual grains during tensile deformation and comparison to a finite element modeling simulation, and the characterization of evolving dislocation structure. Complementary information is obtained by post mortem electron microscopy on the same sample volume previously investigated by HEDM.

U2 - 10.1007/s11837-011-0116-0

DO - 10.1007/s11837-011-0116-0

M3 - Journal article

VL - 63

SP - 70

EP - 77

JO - J O M

JF - J O M

SN - 1047-4838

IS - 7

ER -

Lienert U, Li SF, Hefferan CM, Lind J, Suter RM, Bernier JV et al. High-energy diffraction microscopy at the advanced photon source. J O M. 2011 jul;63(7):70-77. https://doi.org/10.1007/s11837-011-0116-0