Electrical impedance spectroscopy of silicon

Petr Viscor, J. Vedde

    Publikation: Bidrag til bog/antologi/rapportBidrag til bog/antologiForskning

    OriginalsprogEngelsk
    TitelProceedings of the electrochemical society : symposium on diagnostic techniques for semiconductor materials and devices
    RedaktørerP. Rai-Choudhury
    ForlagSPIE - International Society for Optical Engineering
    Publikationsdato1997
    Sider362-376
    StatusUdgivet - 1997
    NavnProceedings of SPIE, the International Society for Optical Engineering
    Nummer12
    Vol/bind1997
    ISSN0277-786X

    Citer dette

    Viscor, P., & Vedde, J. (1997). Electrical impedance spectroscopy of silicon. I P. Rai-Choudhury (red.), Proceedings of the electrochemical society: symposium on diagnostic techniques for semiconductor materials and devices (s. 362-376). SPIE - International Society for Optical Engineering. Proceedings of SPIE, the International Society for Optical Engineering, Nr. 12, Bind. 1997
    Viscor, Petr ; Vedde, J. / Electrical impedance spectroscopy of silicon. Proceedings of the electrochemical society: symposium on diagnostic techniques for semiconductor materials and devices. red. / P. Rai-Choudhury. SPIE - International Society for Optical Engineering, 1997. s. 362-376 (Proceedings of SPIE, the International Society for Optical Engineering; Nr. 12, Bind 1997).
    @inbook{3812d0f052bf11dba4bc000ea68e967b,
    title = "Electrical impedance spectroscopy of silicon",
    author = "Petr Viscor and J. Vedde",
    year = "1997",
    language = "English",
    pages = "362--376",
    editor = "P. Rai-Choudhury",
    booktitle = "Proceedings of the electrochemical society",
    publisher = "SPIE - International Society for Optical Engineering",

    }

    Viscor, P & Vedde, J 1997, Electrical impedance spectroscopy of silicon. i P Rai-Choudhury (red.), Proceedings of the electrochemical society: symposium on diagnostic techniques for semiconductor materials and devices. SPIE - International Society for Optical Engineering, Proceedings of SPIE, the International Society for Optical Engineering, nr. 12, bind 1997, s. 362-376.

    Electrical impedance spectroscopy of silicon. / Viscor, Petr; Vedde, J.

    Proceedings of the electrochemical society: symposium on diagnostic techniques for semiconductor materials and devices. red. / P. Rai-Choudhury. SPIE - International Society for Optical Engineering, 1997. s. 362-376.

    Publikation: Bidrag til bog/antologi/rapportBidrag til bog/antologiForskning

    TY - CHAP

    T1 - Electrical impedance spectroscopy of silicon

    AU - Viscor, Petr

    AU - Vedde, J.

    PY - 1997

    Y1 - 1997

    M3 - Book chapter

    SP - 362

    EP - 376

    BT - Proceedings of the electrochemical society

    A2 - Rai-Choudhury, P.

    PB - SPIE - International Society for Optical Engineering

    ER -

    Viscor P, Vedde J. Electrical impedance spectroscopy of silicon. I Rai-Choudhury P, red., Proceedings of the electrochemical society: symposium on diagnostic techniques for semiconductor materials and devices. SPIE - International Society for Optical Engineering. 1997. s. 362-376. (Proceedings of SPIE, the International Society for Optical Engineering; Nr. 12, Bind 1997).