Electrical impedance spectroscopy as a new characterisation tool for the determination of electrical material parameters in semiconductors and insulators

Petr Viscor, Jan Vedde, Michael Jensen

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

    OriginalsprogEngelsk
    TidsskriftSolid State Phenomena
    Vol/bind69-70
    Sider (fra-til)479-484
    ISSN1012-0394
    StatusUdgivet - 1999

    Citer dette

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    language = "English",
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    Electrical impedance spectroscopy as a new characterisation tool for the determination of electrical material parameters in semiconductors and insulators. / Viscor, Petr; Vedde, Jan; Jensen, Michael.

    I: Solid State Phenomena, Bind 69-70, 1999, s. 479-484.

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

    TY - JOUR

    T1 - Electrical impedance spectroscopy as a new characterisation tool for the determination of electrical material parameters in semiconductors and insulators

    AU - Viscor, Petr

    AU - Vedde, Jan

    AU - Jensen, Michael

    PY - 1999

    Y1 - 1999

    M3 - Journal article

    VL - 69-70

    SP - 479

    EP - 484

    JO - Solid State Phenomena

    JF - Solid State Phenomena

    SN - 1012-0394

    ER -