Application of benchtop micro-XRF to geological materials

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

Resumé

Recent developments in X-ray optics have allowed the development of a range of commercially available benchtop micro-XRF (μ-XRF) instruments that can produce X-ray spot sizes of 20–30 μm on the sample, allowing major- and trace-element analysis on a range of sample types and sizes with minimal sample preparation. Such instruments offer quantitative analysis using fundamental parameter based 'standardless' quantification algorithms. The accuracy and precision of this quantitative analysis on geological materials, and application of micro-XRF to wider geological problems is assessed using a single benchtop micro-XRF instrument. Quantitative analysis of internal reference materials and international standards shows that such instruments can provide highly reproducible data but that, for many silicate materials, standardless quantification is not accurate.Accuracy can be improved, however, by using a simple type-calibration against a reference material of similar matrix and composition. Qualitative analysis with micro-XRF can simplify and streamline sample characterization and processing for subsequent geochemical and isotopic analysis.
SprogEngelsk
TidsskriftMineralogical Magazine
Vol/bind81
Udgave nummer4
Sider923-948
ISSN0026-461X
DOI
StatusUdgivet - aug. 2017

Citer dette

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title = "Application of benchtop micro-XRF to geological materials",
abstract = "Recent developments in X-ray optics have allowed the development of a range of commercially available benchtop micro-XRF (μ-XRF) instruments that can produce X-ray spot sizes of 20–30 μm on the sample, allowing major- and trace-element analysis on a range of sample types and sizes with minimal sample preparation. Such instruments offer quantitative analysis using fundamental parameter based 'standardless' quantification algorithms. The accuracy and precision of this quantitative analysis on geological materials, and application of micro-XRF to wider geological problems is assessed using a single benchtop micro-XRF instrument. Quantitative analysis of internal reference materials and international standards shows that such instruments can provide highly reproducible data but that, for many silicate materials, standardless quantification is not accurate.Accuracy can be improved, however, by using a simple type-calibration against a reference material of similar matrix and composition. Qualitative analysis with micro-XRF can simplify and streamline sample characterization and processing for subsequent geochemical and isotopic analysis.",
author = "Stephanie Flude and Michael Haschke and Michael Storey",
year = "2017",
month = "8",
doi = "10.1180/minmag.2016.080.150",
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Application of benchtop micro-XRF to geological materials. / Flude, Stephanie; Haschke, Michael; Storey, Michael.

I: Mineralogical Magazine, Bind 81, Nr. 4, 08.2017, s. 923-948.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

TY - JOUR

T1 - Application of benchtop micro-XRF to geological materials

AU - Flude, Stephanie

AU - Haschke, Michael

AU - Storey, Michael

PY - 2017/8

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N2 - Recent developments in X-ray optics have allowed the development of a range of commercially available benchtop micro-XRF (μ-XRF) instruments that can produce X-ray spot sizes of 20–30 μm on the sample, allowing major- and trace-element analysis on a range of sample types and sizes with minimal sample preparation. Such instruments offer quantitative analysis using fundamental parameter based 'standardless' quantification algorithms. The accuracy and precision of this quantitative analysis on geological materials, and application of micro-XRF to wider geological problems is assessed using a single benchtop micro-XRF instrument. Quantitative analysis of internal reference materials and international standards shows that such instruments can provide highly reproducible data but that, for many silicate materials, standardless quantification is not accurate.Accuracy can be improved, however, by using a simple type-calibration against a reference material of similar matrix and composition. Qualitative analysis with micro-XRF can simplify and streamline sample characterization and processing for subsequent geochemical and isotopic analysis.

AB - Recent developments in X-ray optics have allowed the development of a range of commercially available benchtop micro-XRF (μ-XRF) instruments that can produce X-ray spot sizes of 20–30 μm on the sample, allowing major- and trace-element analysis on a range of sample types and sizes with minimal sample preparation. Such instruments offer quantitative analysis using fundamental parameter based 'standardless' quantification algorithms. The accuracy and precision of this quantitative analysis on geological materials, and application of micro-XRF to wider geological problems is assessed using a single benchtop micro-XRF instrument. Quantitative analysis of internal reference materials and international standards shows that such instruments can provide highly reproducible data but that, for many silicate materials, standardless quantification is not accurate.Accuracy can be improved, however, by using a simple type-calibration against a reference material of similar matrix and composition. Qualitative analysis with micro-XRF can simplify and streamline sample characterization and processing for subsequent geochemical and isotopic analysis.

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