Application of benchtop micro-XRF to geological materials

Stephanie Flude, Michael Haschke, Michael Storey

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

    Resumé

    Recent developments in X-ray optics have allowed the development of a range of commercially available benchtop micro-XRF (μ-XRF) instruments that can produce X-ray spot sizes of 20–30 μm on the sample, allowing major- and trace-element analysis on a range of sample types and sizes with minimal sample preparation. Such instruments offer quantitative analysis using fundamental parameter based 'standardless' quantification algorithms. The accuracy and precision of this quantitative analysis on geological materials, and application of micro-XRF to wider geological problems is assessed using a single benchtop micro-XRF instrument. Quantitative analysis of internal reference materials and international standards shows that such instruments can provide highly reproducible data but that, for many silicate materials, standardless quantification is not accurate.Accuracy can be improved, however, by using a simple type-calibration against a reference material of similar matrix and composition. Qualitative analysis with micro-XRF can simplify and streamline sample characterization and processing for subsequent geochemical and isotopic analysis.
    OriginalsprogEngelsk
    TidsskriftMineralogical Magazine
    Vol/bind81
    Udgave nummer4
    Sider (fra-til)923-948
    ISSN0026-461X
    DOI
    StatusUdgivet - aug. 2017

    Citer dette

    Flude, Stephanie ; Haschke, Michael ; Storey, Michael. / Application of benchtop micro-XRF to geological materials. I: Mineralogical Magazine. 2017 ; Bind 81, Nr. 4. s. 923-948.
    @article{0ab7570b97404335b775799d69c4ec8c,
    title = "Application of benchtop micro-XRF to geological materials",
    abstract = "Recent developments in X-ray optics have allowed the development of a range of commercially available benchtop micro-XRF (μ-XRF) instruments that can produce X-ray spot sizes of 20–30 μm on the sample, allowing major- and trace-element analysis on a range of sample types and sizes with minimal sample preparation. Such instruments offer quantitative analysis using fundamental parameter based 'standardless' quantification algorithms. The accuracy and precision of this quantitative analysis on geological materials, and application of micro-XRF to wider geological problems is assessed using a single benchtop micro-XRF instrument. Quantitative analysis of internal reference materials and international standards shows that such instruments can provide highly reproducible data but that, for many silicate materials, standardless quantification is not accurate.Accuracy can be improved, however, by using a simple type-calibration against a reference material of similar matrix and composition. Qualitative analysis with micro-XRF can simplify and streamline sample characterization and processing for subsequent geochemical and isotopic analysis.",
    author = "Stephanie Flude and Michael Haschke and Michael Storey",
    year = "2017",
    month = "8",
    doi = "10.1180/minmag.2016.080.150",
    language = "English",
    volume = "81",
    pages = "923--948",
    journal = "Mineralogical Magazine",
    issn = "0026-461X",
    number = "4",

    }

    Application of benchtop micro-XRF to geological materials. / Flude, Stephanie; Haschke, Michael; Storey, Michael.

    I: Mineralogical Magazine, Bind 81, Nr. 4, 08.2017, s. 923-948.

    Publikation: Bidrag til tidsskriftTidsskriftartikelForskningpeer review

    TY - JOUR

    T1 - Application of benchtop micro-XRF to geological materials

    AU - Flude, Stephanie

    AU - Haschke, Michael

    AU - Storey, Michael

    PY - 2017/8

    Y1 - 2017/8

    N2 - Recent developments in X-ray optics have allowed the development of a range of commercially available benchtop micro-XRF (μ-XRF) instruments that can produce X-ray spot sizes of 20–30 μm on the sample, allowing major- and trace-element analysis on a range of sample types and sizes with minimal sample preparation. Such instruments offer quantitative analysis using fundamental parameter based 'standardless' quantification algorithms. The accuracy and precision of this quantitative analysis on geological materials, and application of micro-XRF to wider geological problems is assessed using a single benchtop micro-XRF instrument. Quantitative analysis of internal reference materials and international standards shows that such instruments can provide highly reproducible data but that, for many silicate materials, standardless quantification is not accurate.Accuracy can be improved, however, by using a simple type-calibration against a reference material of similar matrix and composition. Qualitative analysis with micro-XRF can simplify and streamline sample characterization and processing for subsequent geochemical and isotopic analysis.

    AB - Recent developments in X-ray optics have allowed the development of a range of commercially available benchtop micro-XRF (μ-XRF) instruments that can produce X-ray spot sizes of 20–30 μm on the sample, allowing major- and trace-element analysis on a range of sample types and sizes with minimal sample preparation. Such instruments offer quantitative analysis using fundamental parameter based 'standardless' quantification algorithms. The accuracy and precision of this quantitative analysis on geological materials, and application of micro-XRF to wider geological problems is assessed using a single benchtop micro-XRF instrument. Quantitative analysis of internal reference materials and international standards shows that such instruments can provide highly reproducible data but that, for many silicate materials, standardless quantification is not accurate.Accuracy can be improved, however, by using a simple type-calibration against a reference material of similar matrix and composition. Qualitative analysis with micro-XRF can simplify and streamline sample characterization and processing for subsequent geochemical and isotopic analysis.

    U2 - 10.1180/minmag.2016.080.150

    DO - 10.1180/minmag.2016.080.150

    M3 - Journal article

    VL - 81

    SP - 923

    EP - 948

    JO - Mineralogical Magazine

    JF - Mineralogical Magazine

    SN - 0026-461X

    IS - 4

    ER -