Advances in characterization of deformation structures by high resolution reciprocal space mapping

Wolfgang Pantleon, Christian Wejdemann, Bo Jakobsen, Ulrich Lienert, Henning Friis Poulsen

Publikation: Bidrag til bog/antologi/rapportKonferencebidrag i proceedingsForskningpeer review

OriginalsprogEngelsk
TitelChallenges in materials science and possibilities in 3D and 4D characterization techniques : Proceedings of the 31st Risø International Symposium on Materials Science
RedaktørerN. Hansen, D. Juul Jensen, S.F. Nielsen, H.F. Poulsen, B. Ralph
Antal sider22
ForlagDanmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi
Publikationsdato2010
Sider79-100
ISBN (Trykt)978-87-550-3833-2
StatusUdgivet - 2010
Begivenhed31st Risø International Symposium on Materials Science - Roskilde, Danmark
Varighed: 6 okt. 201010 okt. 2010

Konference

Konference31st Risø International Symposium on Materials Science
LandDanmark
ByRoskilde
Periode06/10/201010/10/2010

Citer dette

Pantleon, W., Wejdemann, C., Jakobsen, B., Lienert, U., & Friis Poulsen , H. (2010). Advances in characterization of deformation structures by high resolution reciprocal space mapping. I N. Hansen, D. Juul Jensen, S. F. Nielsen, H. F. Poulsen, & B. Ralph (red.), Challenges in materials science and possibilities in 3D and 4D characterization techniques: Proceedings of the 31st Risø International Symposium on Materials Science (s. 79-100). Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi.